The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Apr. 05, 2013
Applicant:

Korea Aerospace Research Institute, Daejeon, KR;

Inventors:

Hee Won Kang, Daejeon, KR;

Deok Won Lim, Daejeon, KR;

Moon-Beom Heo, Daejeon, KR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01S 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a localization method of multiple based on a TDOA method, including calculating TDOA measurements step Sof arranging multiple sensors, and calculating TDOA measurement values while a reference sensor is changed, in turn; locating multiple jammers using all TDOA measurements step Sof calculating estimated location solutions of the multiple jammers; a finding a searching quadrant step Sof finding a quadrant having the highest density of the estimated location solutions; a setting a searching range and detecting searching cell step Sof deciding a searching range, and searching the searching cell; and determining estimated positions of the multiple jammers step Sof deciding the number of the jammers, and calculating location solutions of the multiple jammers. Therefore, the present invention can accurately localize the multiple jammers.


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