The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 19, 2013

Filed:

Dec. 16, 2010
Applicants:

Gerd Beck, Wurmlingen, DE;

Bernhard Gloeggler, Tuttlingen, DE;

Andre Ehrhardt, Wurmlingen, DE;

Inventors:

Gerd Beck, Wurmlingen, DE;

Bernhard Gloeggler, Tuttlingen, DE;

Andre Ehrhardt, Wurmlingen, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test apparatus for an optical investigation system, with an imaging device and a light source for optical investigation of an object in remitted light and/or fluorescent light includes a housing with a hollow space and an aperture for inserting a distal end of the imaging device into the hollow space, a reference surface with predetermined optical properties in the hollow space, at least either for remission of illuminating light directed onto the reference surface or for emission of fluorescent light, and a positioning device to hold the imaging device of the distal end of the imaging device at a predetermined position in relation to the reference surface.


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