The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Sep. 23, 2009
Heikki Haveri, Humhari, FI;
Kurt Peter Weckstrom, Frasavagen, FI;
Heikki Haveri, Humhari, FI;
Kurt Peter Weckstrom, Frasavagen, FI;
General Electric Company, Schenectady, NY (US);
Abstract
A non-dispersive single beam detection assembly in an infrared gas analyzer. The detection assembly comprises radiation source(s) providing infrared radiation, a measuring chamber, and a physical beam splitter for dividing said radiation beam into a reflected beam portion and a transmitted beam portion, or for combining a reflected beam portion and a transmitted beam portion into said radiation beam. A measuring detector receives one beam portions, and a reference detector receives another beam portion. Alternatively a measuring/reference detector receives both beam portions. Said transmitted beam portion has a first spectral intensity peak at shorter wavelengths with a first peak wavelength, and said reflected beam portion has a second spectral intensity peak at longer wavelengths with a second peak wavelength. There is a wavelength gap between said second peak wavelength and said first peak wavelength, which gap corresponds a wavelength shift of an optical interference filter with said second peak wavelength as tilted from its perpendicular position to an angled position. Said wavelength gap is at maximum 10% of the second peak wavelength, and at minimum 0.5% of the second peak wavelength.