The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8585880 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 19, 2013

Filed:

Sep. 27, 2011
Applicants:

Sayandev Chatterjee, Richland, WA (US);

Samuel A. Bryan, Richland, WA (US);

Cynthia A. Schroll, Kettering, OH (US);

William R. Heineman, Cincinnati, OH (US);

Inventors:

Sayandev Chatterjee, Richland, WA (US);

Samuel A. Bryan, Richland, WA (US);

Cynthia A. Schroll, Kettering, OH (US);

William R. Heineman, Cincinnati, OH (US);

Assignee:

Battelle Memorial Institute, Richland, WA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/75 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus and method of simultaneous spectroelectrochemical analysis is disclosed. A transparent surface is provided. An analyte solution on the transparent surface is contacted with a working electrode and at least one other electrode. Light from a light source is focused on either a surface of the working electrode or the analyte solution. The light reflected from either the surface of the working electrode or the analyte solution is detected. The potential of the working electrode is adjusted, and spectroscopic changes of the analyte solution that occur with changes in thermodynamic potentials are monitored.


Find Patent Forward Citations

Chatterjee, Sayandev. (2013). Method and apparatus for simultaneous spectroelectrochemical analysis (U.S. Patent No. 8585880). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8585880

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