The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
Jan. 21, 2008
Dirk Zimmermann, Zug, CH;
Ernst Bamberg, Kelkheim Taunus, DE;
Ulrich Zimmermann, Walbrunn, DE;
Markus Westhoff, Wuerzburg, DE;
Randolph Reuss, Heidelberg, DE;
Albert Gessner, Wuerzburg, DE;
Willibald Bauer, Hafenlohr, DE;
Dirk Zimmermann, Zug, CH;
Ernst Bamberg, Kelkheim Taunus, DE;
Ulrich Zimmermann, Walbrunn, DE;
Markus Westhoff, Wuerzburg, DE;
Randolph Reuss, Heidelberg, DE;
Albert Gessner, Wuerzburg, DE;
Willibald Bauer, Hafenlohr, DE;
Max-Planck-Gesellschaft zur Foerderung der Wissenschaften e.V., Munich, DE;
Julius-Maximilians-Universitaet Wuerzburg, Wuerzburg, DE;
Zim Plant Technology GmbH, Hennigsdorf, DE;
Abstract
A method of determining a pressure parameter of a plant sample () comprises the steps of subjecting the plant sample () to a clamp pressure (p) created with a clamp device (), measuring at least one pressure response value (p) of the plant sample (), which depends on the clamp pressure (P)/and determining the pressure parameter on the basis of the at least one pressure response value (p), wherein the clamp pressure (p) is adjusted, such that the plant sample () has a viscoelastic pressure response to the clamp pressure (p). Furthermore, an apparatus () for determining a pressure parameter of a plant sample () is described.