The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 19, 2013
Filed:
May. 16, 2006
James V. Candy, Danville, CA (US);
David S. Clague, Livermore, CA (US);
Christopher L. Lee, Oakland, CA (US);
Robert E. Rudd, Livermore, CA (US);
Alan K. Burnham, Livermore, CA (US);
Joseph W. Tringe, Walnut Creek, CA (US);
James V. Candy, Danville, CA (US);
David S. Clague, Livermore, CA (US);
Christopher L. Lee, Oakland, CA (US);
Robert E. Rudd, Livermore, CA (US);
Alan K. Burnham, Livermore, CA (US);
Joseph W. Tringe, Walnut Creek, CA (US);
lawrence Livermore National Security, LLC., Livermore, CA (US);
Abstract
A method of using physics-based signal processing algorithms for micromachined cantilever arrays. The methods utilize deflection of a micromachined cantilever that represents the chemical, biological, or physical element being detected. One embodiment of the method comprises the steps of modeling the deflection of the micromachined cantilever producing a deflection model, sensing the deflection of the micromachined cantilever and producing a signal representing the deflection, and comparing the signal representing the deflection with the deflection model.