The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2013
Filed:
Nov. 12, 2010
Sakura Bhandari, Kanagawa, JP;
Yuriko Nishikawa, Kanagawa, JP;
Kaoru Shinkawa, Tokyo, JP;
Yoshinori Tahara, Kanagawa, JP;
Sakura Bhandari, Kanagawa, JP;
Yuriko Nishikawa, Kanagawa, JP;
Kaoru Shinkawa, Tokyo, JP;
Yoshinori Tahara, Kanagawa, JP;
International Business Machines Corporation, Armonk, NY (US);
Abstract
Testing of a computer program product by selecting a test node at which a snapshot is to be acquired to enable the completion of tests along test scenarios in the shortest time is provided. Information on a test scenario, information on a test node to which a test node makes a next transition, and other information are stored. For each test node, it is determined whether a branch path exists, and for each of these test nodes, an estimated execution time required to complete a test when a snapshot is acquired at a test node is calculated, an execution time required to complete a test without acquiring any snapshot is calculated, and a difference between the execution time and the estimated execution time is calculated as a reduced time. A test node with the longest reduced time is selected, and information for identifying the selected test node is output.