The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Dec. 23, 2010
Applicants:

Zhiqiang Chen, San Ramon, CA (US);

Anjesh Dubey, Sunnyvale, CA (US);

Worley Ortiz, San Francisco, CA (US);

Mark A. Fischer, Ashland, OR (US);

Thom Kim, San Francisco, CA (US);

Andrew Tsui, San Francisco, CA (US);

Fiaz Hossain, San Francisco, CA (US);

Pallav Kothari, San Francisco, CA (US);

Inventors:

Zhiqiang Chen, San Ramon, CA (US);

Anjesh Dubey, Sunnyvale, CA (US);

Worley Ortiz, San Francisco, CA (US);

Mark A. Fischer, Ashland, OR (US);

Thom Kim, San Francisco, CA (US);

Andrew Tsui, San Francisco, CA (US);

Fiaz Hossain, San Francisco, CA (US);

Pallav Kothari, San Francisco, CA (US);

Assignee:

salesforce.com, inc., San Francisco, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for identifying bugs in a database system. In one embodiment, a method includes running a plurality of tests on a software application, and rerunning one or more tests of the plurality of tests. The method also includes identifying one or more bugs in the one or more tests based on inconsistent test results.


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