The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Mar. 28, 2011
Applicants:

Takayuki Nagai, Machida, JP;

Masataka Nagura, Yokohama, JP;

Takaki Kuroda, Machida, JP;

Inventors:

Takayuki Nagai, Machida, JP;

Masataka Nagura, Yokohama, JP;

Takaki Kuroda, Machida, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/173 (2006.01);
U.S. Cl.
CPC ...
Abstract

An object of the present invention is to create information for use in problem analysis only for a required event in a case where an event denoting a change in the configuration of a computer system has been detected. A management apparatus detects a configuration change of the computer system as an event and records this event in an event management table T. The management apparatus holds an event propagation model for analyzing a problem, and records an event corresponding to the event propagation model in target event management information T. The management apparatus executes a problem analysis process in a case where a detected event is registered in the target event management information.


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