The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

May. 27, 2009
Applicants:

SO Kitazawa, Mito, JP;

Naoyuki Kono, Mito, JP;

Atsushi Baba, Tokai, JP;

Inventors:

So Kitazawa, Mito, JP;

Naoyuki Kono, Mito, JP;

Atsushi Baba, Tokai, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G10K 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Ultrasonic inspection equipment facilitates alignment of display positions of three-dimensional ultrasonic inspection data and three-dimensional shape data, and quickly discriminates between a defect echo and an inner-wall echo. A computerA has a position correction function of correcting a relative display position between three-dimensional shape data and three-dimensional ultrasonic inspection data. A display position of the three-dimensional ultrasonic inspection data or that of the three-dimensional shape data is moved by a norm of a mean vector along the mean vector that is calculated from a plurality of vectors defined by a plurality of points selected in the three-dimensional ultrasonic inspection data and by a plurality of points selected in the three-dimensional shape data. The three-dimensional shape data and the three-dimensional ultrasonic inspection data are displayed in such a manner as to be superimposed on each other on a three-dimensional display unitC.


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