The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Apr. 07, 2011
Applicant:

Huai Dong LI, Cupertino, CA (US);

Inventor:

Huai Dong Li, Cupertino, CA (US);

Assignee:

Aptina Imaging Corporation, George Town, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

Imaging systems with image sensors and image processing circuitry are provided. The image processing circuitry may calculate sharpness values for a window within an image captured by the image sensors. The window may be divided into zones. A first filter may be applied to each row of each zone. A first sharpness value may be calculated by averaging the absolute values of the outputs of the first filter that are greater than a first threshold. A second sharpness value may be calculated by averaging the absolute values of the outputs of the second filter that are greater than a second threshold. A final sharpness value for each zone may be calculated by dividing the second sharpness value by the first sharpness value and multiplying the result by corresponding scalar weights. A window sharpness value may be calculated from the weighted sum of the final sharpness values of each zone.


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