The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2013
Filed:
May. 05, 2008
Applicants:
Kunlong Gu, Belmont, CA (US);
Akira Hasegawa, Saratoga, CA (US);
Huzefa Neemuchwala, Sunnyvale, CA (US);
Inventors:
Kunlong Gu, Belmont, CA (US);
Akira Hasegawa, Saratoga, CA (US);
Huzefa Neemuchwala, Sunnyvale, CA (US);
Assignee:
FUJIFILM Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods and apparatuses perform thickness compensation in anatomical images. The method according to one embodiment accesses digital image data representing an image including a breast; estimates thickness of the breast at multiple locations inside the breast using an image data characteristic and a reference tissue in the breast; compensates thickness of the breast using a thickness model; and refines compensation of breast thickness from the compensating step.