The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2013
Filed:
Nov. 30, 2010
Applicant:
Geoffrey Harding, Hamburg, DE;
Inventor:
Geoffrey Harding, Hamburg, DE;
Assignee:
Morpho Detection, Inc., Newark, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/06 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method for identifying a substance includes determining a first molecular interference function (MIF) for a first substance. The method also includes determining a second MIF for a second substance. The method further includes generating a residual MIF at least partially based on a comparison of the second MIF to the first MIF. The method also includes identifying the type of substance based on the residual MIF.
Harding, Geoffrey. (2013). Method and system for deriving molecular interference functions from xrd profiles (U.S. Patent No. 8582718). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8582718
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile