The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2013
Filed:
Jul. 20, 2009
Christopher William Dunsby, Leighton Buzzard, GB;
Christopher William Dunsby, Leighton Buzzard, GB;
Imperial Innovations Limited, London, GB;
Abstract
An optical arrangement for oblique plane microscopy includes a first optical subassembly having an objective lens that receives light from a sample in use, and configured to produce an intermediate image of the sample, and a second optical subassembly focused on the intermediate image. Optical axes of the first and second subassemblies are at an angle to each other at the point of the intermediate image, such that the second subassembly images an oblique plane in the intermediate image, corresponding to an oblique plane in the sample. An oblique plane microscopy method is performed by directing an incident light beam through the objective lens to illuminate or excite the oblique plane in the sample, and receiving light from the sample through the same objective lens. The incident light beam is incident on the sample at an angle of substantially 90° relative to the light beam received from the sample.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile