The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2013
Filed:
Nov. 04, 2008
Perry A. Palumbo, Fort Collins, CO (US);
Brian Harmon, Loveland, CO (US);
Perry A. Palumbo, Fort Collins, CO (US);
Brian Harmon, Loveland, CO (US);
Hach Company, Loveland, CO (US);
Abstract
An automatic optical measurement system () is provided. The measurement system () includes a sample vial () and an automatic optical measurement apparatus () configured to receive the sample vial (). The automatic optical measurement apparatus () is configured to detect a presence of the sample vial () in the automatic optical measurement apparatus () and measure a light intensity of light substantially passing through the sample vial () if the sample vial () is present. The measured light intensity is related to sample material properties of a sample material within the sample vial ().