The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2013
Filed:
Jul. 02, 2009
Applicant:
Baoliang Wang, Hillsboro, OR (US);
Inventor:
Baoliang Wang, Hillsboro, OR (US);
Assignee:
Hinds Instruments, Inc., Hillsboro, OR (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 4/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Improving the throughput of systems for measuring birefringence of optical samples includes techniques for directing multiple beams through the photoelastic modulator component of the system so that, along with expanded detection mechanisms to accommodate the multiple beams, the heretofore scanning (via a single beam) of a line across the sample is considerably enlarged so that several lines covering a 'swath' of the sample area is scanned by the system of the present invention.