The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Sep. 06, 2011
Applicant:

Takeshi Nakata, Tokyo, JP;

Inventor:

Takeshi Nakata, Tokyo, JP;

Assignee:

NEC Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 1/42 (2006.01);
U.S. Cl.
CPC ...
Abstract

An optical filter performs filtering on input monitor light in a transmission range having a carrier frequency of each channel being measured as a center frequency. Photoelectric convertors convert the monitor light filtered by the optical filter into an electrical monitor signal, and the signal detection unit judges whether signal light is present or absent based on the electrical monitor signal. Since the optical filter performs filtering, an S/N ratio of the monitor light becomes great and the signal detection unit can more accurately judge whether signal light is present or absent even in an optically noisy environment.


Find Patent Forward Citations

Nakata, Takeshi. (2013). Signal light monitoring apparatus and signal light monitoring method (U.S. Patent No. 8582093). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8582093

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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