logo

For the Inventor, By the Inventor

The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8582068 B1

PDFFull Text
Date of Patent:
Nov. 12, 2013

Filed:

Apr. 28, 2009

Active matrix substrate with connections of switching elements and inspecting wirings, display device, method for inspecting active matrix substrate, and method for inspecting display device

Applicants:

Takehiko Kawamura, Osaka, JP;

Kazunori Tanimoto, Osaka, JP;

Isao Ogasawara, Osaka, JP;

Masahiro Yoshida, Osaka, JP;

Hideaki Takizawa, Osaka, JP;

Inventors:

Takehiko Kawamura, Osaka, JP;

Kazunori Tanimoto, Osaka, JP;

Isao Ogasawara, Osaka, JP;

Masahiro Yoshida, Osaka, JP;

Hideaki Takizawa, Osaka, JP;

Assignee:

Sharp Kabushiki Kaisha, Osaka-shi, JP;

Attorney:

Birch, Stewart, Kolasch & Birch, LLP

Primary Examiner:

Hoan C Nguyen

Int. Cl.
CPC ...
G02F 1/1345 (2006.01); G02F 1/136 (2006.01); G09G 3/36 (2006.01); H01L 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An active matrix substrate is provided with first inspection wirings () capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings () and to second switching wirings that are not adjacent to each other among the second switching wirings (), and second inspection wirings () capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings () and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings ().

Find Patent Forward Citations

Kawamura, Takehiko. (2013). Active matrix substrate with connections of switching elements and inspecting wirings, display device, method for inspecting active matrix substrate, and method for inspecting display device (U.S. Patent No. 8582068). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8582068

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…