The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Apr. 28, 2009
Applicants:

Takehiko Kawamura, Osaka, JP;

Kazunori Tanimoto, Osaka, JP;

Isao Ogasawara, Osaka, JP;

Masahiro Yoshida, Osaka, JP;

Hideaki Takizawa, Osaka, JP;

Inventors:

Takehiko Kawamura, Osaka, JP;

Kazunori Tanimoto, Osaka, JP;

Isao Ogasawara, Osaka, JP;

Masahiro Yoshida, Osaka, JP;

Hideaki Takizawa, Osaka, JP;

Assignee:

Sharp Kabushiki Kaisha, Osaka-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02F 1/1345 (2006.01); G02F 1/136 (2006.01); G09G 3/36 (2006.01); H01L 29/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

An active matrix substrate is provided with first inspection wirings () capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings () and to second switching wirings that are not adjacent to each other among the second switching wirings (), and second inspection wirings () capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings () and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings ().


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