The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

May. 18, 2011
Applicants:

Peng Lin, Pleasanton, CA (US);

Scott Smith, San Jose, CA (US);

Robert A. Black, Milpitas, CA (US);

Inventors:

Peng Lin, Pleasanton, CA (US);

Scott Smith, San Jose, CA (US);

Robert A. Black, Milpitas, CA (US);

Assignee:

Aptina Imaging Corporation, George Town, KY;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04N 5/225 (2006.01);
U.S. Cl.
CPC ...
Abstract

Electronic devices may include camera modules. A camera module may include an array camera having an array of lenses and an array of corresponding image sensors. Parallax correction and depth mapping methods may be provided for array cameras. A parallax correction method may include a global and a local parallax correction. A global parallax correction may be determined based on one-dimensional horizontal and vertical projections of edge images. Local parallax corrections may be determined using a block matching procedure. Further improvements to local parallax corrections may be generated using a relative block color saturation test, a smoothing of parallax correction vectors and, if desired, using a cross-check between parallax correction vectors determined for multiple image sensors. Three dimensional depth maps may be generated based on parallax correction vectors.


Find Patent Forward Citations

Loading…