The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 12, 2013
Filed:
Jun. 24, 2010
Keith L. Mciver, Seal Beach, CA (US);
Aristidis Sidiropoulos, Seal Beach, CA (US);
Russell L. Keller, Maple Valley, WA (US);
Cong N. Duong, Yorba Linda, CA (US);
Keith L. McIver, Seal Beach, CA (US);
Aristidis Sidiropoulos, Seal Beach, CA (US);
Russell L. Keller, Maple Valley, WA (US);
Cong N. Duong, Yorba Linda, CA (US);
The Boeing Company, Chicago, IL (US);
Abstract
A strain measurement device to assess the integrity of a structural repair to a surface comprises a detector, a processor, and a memory module coupled to the processor. The memory module comprises logic instructions stored in a computer readable medium which, when executed by the processor, configure the processor to use the detector to obtain a first strain measurement from an external strain indicator, use the detector to obtain a second strain measurement from the measurement sensor after at least one stress test is applied to the structural repair, and generate a signal when a difference between the first strain measurement and the second strain measurement exceeds a threshold.