The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Jul. 05, 2007
Applicants:

Martin Peschke, Munich, DE;

Alexander Schild, Feldkirchen, DE;

Inventors:

Martin Peschke, Munich, DE;

Alexander Schild, Feldkirchen, DE;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a probe () for an oscilloscope () comprising a multi-stage transistor amplifier () which is used as an impedance transformer and the output of which is connected to the oscilloscope (). An electronic switching device () that can be remote-controlled by means of the oscilloscope () is assigned to the input (V) of the amplifier (). Said electronic switching device () allows frame potential or a reference voltage to be alternatively connected to the amplifier input (V) instead of the measuring-circuit voltage of the measuring tip () such that the direct voltage offset is measured when the amplifier input (V) is connected to frame while the gain error in the oscilloscope () is measured when the reference voltage is applied, and said direct voltage offset or gain error is adequately taken into account when the measuring-circuit voltage in the oscilloscope is evaluated.


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