The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8581194 B1

PDF
Full Text
Expired
Date of Patent:
Nov. 12, 2013

Filed:

Dec. 13, 2011
Applicants:

Hakon Mikkelsen, Aldenhoven, DE;

Ralf Bernhard, Stuttgart, DE;

Inventors:

Hakon Mikkelsen, Aldenhoven, DE;

Ralf Bernhard, Stuttgart, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 5/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring a spectrum of an optical sensor, advantageously in the infrared region, in which a light beam impinges on an optical sensor in contact with a medium to be measured, wherein the optical sensor transmits a measurement beam changed by the medium to be measured and the measurement beam is fed to a pyrodetector, which issues output signals corresponding to the spectrum. The intensity of the measurement signal is modulated before impinging on a pyrodetector. In order to provide a cost effective, vibration free measuring apparatus, which has a long lifetime, intensity modulation of measurement beam occurs by tuning-in wavelengths contained in the optical spectrum of measuring beam.


Find Patent Forward Citations

Mikkelsen, Hakon. (2013). Method and apparatus for measuring a spectrum of an optical sensor, advantageously in the infrared region (U.S. Patent No. 8581194). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8581194

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