The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Sep. 08, 2009
Applicants:

David A. Schwartz, Encinitas, CA (US);

Stephen J. Kron, Oak Park, IL (US);

Inventors:

David A. Schwartz, Encinitas, CA (US);

Stephen J. Kron, Oak Park, IL (US);

Assignee:

University of Chicago, Chicago, IL (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
C12Q 1/00 (2006.01); C12Q 1/68 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is a method for detecting the extent of DNA damage in a subject suspected of having DNA damage wherein the damage results in the formation of aldehyde moieties in DNA comprising, obtaining a DNA sample from the subject, combining the DNA sample with a fluorescent, chromogenic, pro-fluorescent or pro-chromogenic hydrazine compound to from a fluorescent DNA, detecting the presence of the fluorescent DNA by monitoring the fluorescent emission and quantitating the fluorescent emission thereby determining the extent of DNA damage in the subject.


Find Patent Forward Citations

Schwartz, David. (2013). Methods and compositions for direct detection of dna damage (U.S. Patent No. 8580516). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8580516

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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