The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 12, 2013

Filed:

Dec. 08, 2010
Applicant:

Yoshinori Matsuyama, Aichi, JP;

Inventor:

Yoshinori Matsuyama, Aichi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/20 (2006.01); G02C 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An apparatus for measuring a shape of an eyeglass frame, includes: a tracing stylus to detect a position of the rim in a moving radius direction and in a vertical, a tracing stylus shaft for the tracing stylus, a holding unit movably holding the tracing stylus shaft and including a pressure applying element for pressing a tip end of the tracing stylus to the rim, a moving unit for moving the holding unit, a rotating unit for rotating the holding unit around an axis along a vertical direction; a moving radius position detection unit configured to detect a position of the tracing stylus; and a controller configured to obtain a rotating angle of the rotating unit and a position of the holding unit in the moving radius direction at a next measurement position, and control the rotating unit and the moving unit.


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