The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Jun. 17, 2010
Patrice Godefroid, Mercer Island, WA (US);
Shuvendu Kumar Lahiri, Redmond, WA (US);
Cindy Rubio-gonzalez, Madison, WI (US);
Patrice Godefroid, Mercer Island, WA (US);
Shuvendu Kumar Lahiri, Redmond, WA (US);
Cindy Rubio-Gonzalez, Madison, WI (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
Concepts and technologies are described herein for incremental compositional dynamic test generation. The concepts and technologies described herein are used to increase the code coverage and security vulnerability identification abilities of testing applications and devices, without significantly increasing, and in some cases decreasing, computational and time costs associated with the testing. Test summaries that describe how code is tested by a test engine are generated and stored during testing of code. These test summaries can be evaluated when additional iterations or versions of the code are tested. If functions corresponding to the test summaries are unchanged from, or logically equivalent to, a version of the function previously tested, the test summary may be used when testing the new version of the code.