The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Jan. 04, 2010
Shaohua Yang, Santa Clara, CA (US);
Jonseung Park, Allentown, PA (US);
Changyou Xu, Fremont, CA (US);
Madhusudan Kalluri, Sunnyvale, CA (US);
Yuan Xing Lee, San Jose, CA (US);
Kapil Gaba, Fremont, CA (US);
Shaohua Yang, Santa Clara, CA (US);
Jonseung Park, Allentown, PA (US);
Changyou Xu, Fremont, CA (US);
Madhusudan Kalluri, Sunnyvale, CA (US);
Yuan Xing Lee, San Jose, CA (US);
Kapil Gaba, Fremont, CA (US);
LSI Corporation, San Jose, CA (US);
Abstract
Various embodiments of the present invention provide systems and methods for updating detector parameters in a data processing circuit. For example, a data processing circuit is disclosed that includes a first detector circuit, a second detector circuit, and a calibration circuit. The first detector circuit is operable to receive a first data set and to apply a data detection algorithm to the first data set, and the second detector circuit is operable to receive a second data set and to apply the data detection algorithm to the second data set. The calibration circuit is operable to calculate a data detection parameter based upon a third data set. The data detection parameter is used by the first detector circuit in applying the data detection algorithm to the first data set during a period that the data detection parameter is used by the second detector circuit in applying the data detection algorithm to the second data set.