The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Sep. 08, 2011
Applicants:

Prashant Udupa Sripathi, Santa Clara, CA (US);

Jittra Jootar, Santa Clara, CA (US);

Je Woo Kim, Santa Clara, CA (US);

Feng LU, Santa Clara, CA (US);

Inventors:

Prashant Udupa Sripathi, Santa Clara, CA (US);

Jittra Jootar, Santa Clara, CA (US);

Je Woo Kim, Santa Clara, CA (US);

Feng Lu, Santa Clara, CA (US);

Assignee:

Qualcomm Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01); H03M 13/03 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of data classification for use in a wireless communication system includes obtaining decoder metrics from a decoder. The decoder metrics correspond to data generated by the decoder. The decoder metrics include a first metric and a second metric. The method also includes classifying the data into a first category if the data fails an error detection check, into a second category if the data passes the error detection check and is determined to be unreliable, or into a third category if the data passes the error detection check and is determined to be reliable. A reliability of the data is determined based on at least one of the decoder metrics and a threshold.


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