The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Jan. 08, 2010
Kuansan Wang, Bellevue, WA (US);
Xiaolong LI, Sammamish, WA (US);
Jiangbo Miao, Redmond, WA (US);
Frederic H. Behr, Jr., Kirkland, WA (US);
Kuansan Wang, Bellevue, WA (US);
Xiaolong Li, Sammamish, WA (US);
Jiangbo Miao, Redmond, WA (US);
Frederic H. Behr, Jr., Kirkland, WA (US);
Microsoft Corporation, Redmond, WA (US);
Abstract
A statistical language model (SLM) may be iteratively refined by considering N-gram counts in new data, and blending the information contained in the new data with the existing SLM. A first group of documents is evaluated to determine the probabilities associated with the different N-grams observed in the documents. An SLM is constructed based on these probabilities. A second group of documents is then evaluated to determine the probabilities associated with each N-gram in that second group. The existing SLM is then evaluated to determine how well it explains the probabilities in the second group of documents, and a weighting parameter is calculated from that evaluation. Using the weighting parameter, a new SLM is then constructed as a weighted average of the existing SLM and the new probabilities.