The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
May. 23, 2011
Tsai-ching LU, Wynnewood, PA (US);
Yilu Zhang, Northvlle, MI (US);
Alejandro Nijamkin, Simi Valley, CA (US);
David L. Allen, Thousand Oaks, CA (US);
Hankyu Moon, Oak Park, CA (US);
Mutasim A. Salman, Rochester Hills, MI (US);
Tsai-Ching Lu, Wynnewood, PA (US);
Yilu Zhang, Northvlle, MI (US);
Alejandro Nijamkin, Simi Valley, CA (US);
David L. Allen, Thousand Oaks, CA (US);
Hankyu Moon, Oak Park, CA (US);
Mutasim A. Salman, Rochester Hills, MI (US);
GM Global Technology Operations LLC, Detroit, MI (US);
Abstract
A system and method for identifying a monitoring point in an electrical and electronic system (EES) in a vehicle. The method includes defining a network model of the EES where potential monitoring point locations in the model are identified as targets, such as nodes. The method then computes a betweenness centrality metric for each target in the model as a summation of a ratio of a number of shortest paths between each pair of targets in the model that pass through the target whose betweenness centrality metric is being determined to a total number of shortest paths between each pair of targets. The method identifies which of the betweenness centrality metrics are greater than a threshold that defines a minimum acceptable metric and determines which of those targets meets a predetermined model coverage. The monitoring point is selected as the target that best satisfies the minimum metric and the desired coverage.