The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Oct. 23, 2008
Applicants:

Florent Miller, Levallois, FR;

Nadine Buard, Meudon, FR;

Cecile Weulersse, Versailles, FR;

Thierry Carriere, Triel sur Seine, FR;

Patrick Heins, Castelnau de Montmiral, FR;

Inventors:

Florent Miller, Levallois, FR;

Nadine Buard, Meudon, FR;

Cecile Weulersse, Versailles, FR;

Thierry Carriere, Triel sur Seine, FR;

Patrick Heins, Castelnau de Montmiral, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

To analyze an electronic component, this component is exposed to a focused laser beam. The information provided by the laser mapping relating to the position and to the depth of the sensitivity zones of the component is used as input parameter in prediction codes for quantifying the sensitivity of the mapped component to ionizing particles in the natural radioactive environment. The prediction codes are used to determine the occurrence of malfunctions in the electronic component. Determination of the risks associated with the radiative environment imposes two aspects: one, probabilistic, takes into account the particle/matter interaction and the other, electrical, takes into account the charge collection inside the electronic component.


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