The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Mar. 04, 2011
Applicants:

Lun Zhang, Beijing, CN;

Weiguo Wu, Beijing, CN;

Inventors:

Lun Zhang, Beijing, CN;

Weiguo Wu, Beijing, CN;

Assignee:

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/46 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus that classify an image. The method extracts a feature vector from the image, wherein the feature vector includes a plurality of first features. The extracting of each of the first features includes: acquiring a difference between sums or mean values of pixels of the plurality of first areas in the corresponding combination to obtain a first difference vector in the direction of the first axis, and obtaining a second difference vector in the direction of the second axis. A first projection difference vector is acquired with a second projection difference vector. A sum of magnitudes of the first projection difference vector and the second projection difference vector as the first feature is obtained; and the image according to the extracted feature vector is classified.


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