The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Mar. 15, 2010
Applicants:

Maneesh Dewan, West Chester, PA (US);

Yiqiang Zhan, Berwyn, PA (US);

Xiang Sean Zhou, Exton, PA (US);

Zhao Yi, Pasadena, CA (US);

Inventors:

Maneesh Dewan, West Chester, PA (US);

Yiqiang Zhan, Berwyn, PA (US);

Xiang Sean Zhou, Exton, PA (US);

Zhao Yi, Pasadena, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/62 (2006.01);
U.S. Cl.
CPC ...
Abstract

Described herein is a technology for facilitating deformable model-based segmentation of image data. In one implementation, the technology includes receiving training image data () and automatically constructing a hierarchical structure () based on the training image data. At least one spatially adaptive boundary detector is learned based on a node of the hierarchical structure ().


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