The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Nov. 30, 2010
Joong Lee, Seoul, KR;
Young Su Lee, Seoul, KR;
Jun Suk Kim, Seoul, KR;
Ki Woong Moon, Seoul, KR;
Byung Wook Park, Seoul, KR;
Joong Lee, Seoul, KR;
Young Su Lee, Seoul, KR;
Jun Suk Kim, Seoul, KR;
Ki Woong Moon, Seoul, KR;
Byung Wook Park, Seoul, KR;
Abstract
Disclosed herein is a forged seal imprint checking method which includes a step ST-of generating a reference seal imprint from a genuine seal (ST-) and a step ST-of comparing a compared seal imprints with the reference seal imprint to calculate characteristic values of the compared seal imprint with respect to the reference seal imprint (ST-). According to experimental results, forged seal imprints obtained by seals forged by etching a zinc plate or a resin plate can be recognized and forged seal imprints generated by seals forged through computer copy can be also recognized. Accordingly, an objective basis on which it can be determined whether seal imprints on documents are forged in civil and criminal cases can be provided to prevent errors which may be generated when seal imprints are inspected with the naked eyes or microscopes.