The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Jun. 23, 2009
Susumu Mori, Ellicott City, MD (US);
Hangyi Jiang, Cockeysville, MD (US);
Ming-chung Chou, Taichung County, TW;
Yue LI, Baltimore, MD (US);
Susumu Mori, Ellicott City, MD (US);
Hangyi Jiang, Cockeysville, MD (US);
Ming-Chung Chou, Taichung County, TW;
Yue Li, Baltimore, MD (US);
The John Hopkins University, Baltimore, MD (US);
Abstract
Featured is a method for automatically evaluating acquired MRI data, determining the quality of the acquired images and removing the image data when it is determined that an image is corrupted so the imaged data for the corrupted image is removed from the subsequent tensor fitting. In further embodiments, such determining includes judging the quality of the image data to determine if the image data satisfies a quality threshold criteria and if determined not to be satisfied adjudging the image to be corrupted. Such methods include performing said evaluating, determining and removing in real time and in the case where an image is determined to be corrupted, such methods further includes re-acquiring additional image data corresponding to each of the one or more images removed as being corrupted. Also featured are MRI systems embodying such methods.