The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Sep. 13, 2010
Applicants:

Astrid Lewalter, Aachen, DE;

Rainer Pietig, Malsch, DE;

Wolfgang Chrost, Hamburg, DE;

Inventors:

Astrid Lewalter, Aachen, DE;

Rainer Pietig, Malsch, DE;

Wolfgang Chrost, Hamburg, DE;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 35/08 (2006.01); H01J 35/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A distributed X-ray source () and an imaging system () comprising such an X-ray source () are proposed. The X-ray source () comprises an electron beam source arrangement () and an anode arrangement (). The electron beam source arrangement () is adapted to emit electron beams () towards at least two locally distinct focal spots () on the anode arrangement (). Therein, the X-ray source is adapted for displacing the anode arrangement () with respect to the electron beam source arrangement (). While the provision of a plurality of focal spots allows acquisition of projection images under different projection angles thereby allowing reconstruction of three-dimensional X-ray images e.g. in tomosynthesis application, a displacement motion of the anode arrangement () with respect to the electron beam source arrangement () may allow for distributed heat flux to the anode arrangement thereby possibly reducing cooling requirements.


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