The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Jan. 21, 2011
James Zhengshe Liu, Glenview, IL (US);
Paul Richard Granfors, Berkeley, CA (US);
Kenneth Scott Kump, Waukesha, WI (US);
Ping Xue, Pewaukee, WI (US);
Donald Fayette Langler, Brookfield, WI (US);
Brian John Kost, Waukesha, WI (US);
James Zhengshe Liu, Glenview, IL (US);
Paul Richard Granfors, Berkeley, CA (US);
Kenneth Scott Kump, Waukesha, WI (US);
Ping Xue, Pewaukee, WI (US);
Donald Fayette Langler, Brookfield, WI (US);
Brian John Kost, Waukesha, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
An X-ray imaging method includes in a digital X-ray detector including an array of discrete picture elements each including a photodiode and a transistor, applying a first voltage to the transistors of the discrete picture elements. The method also includes preparing for acquisition of X-ray image data by sampling data from the discrete picture elements while applying a second voltage to the transistors of the discrete picture elements not then being sampled, the second voltage being more negative than the first voltage. The method further includes receiving X-ray radiation on the detector from a source. The method yet further includes sampling X-ray image data from the discrete picture elements while applying the second voltage to the transistors of the discrete picture elements not then being sampled.