The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Feb. 09, 2009
Applicants:

Christian Baeumer, Hergenrath, BE;

Klaus Juergen Engel, Aachen, DE;

Christoph Herrmann, Aachen, DE;

Inventors:

Christian Baeumer, Hergenrath, BE;

Klaus Juergen Engel, Aachen, DE;

Christoph Herrmann, Aachen, DE;

Assignee:

Koninklijke Philips N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to an X-ray detector () that comprises an array of sensitive elements (P, P, P, P, P) and at least two analyzer gratings (G, G) disposed with different phase and/or periodicity in front of two different sensitive elements. Preferably, the sensitive elements are organized in macro-pixels (II) of e.g. four adjacent sensitive elements, where analyzer gratings with mutually different phases are disposed in front said sensitive elements. The detector () can particularly be applied in an X-ray device () for generating phase contrast images because it allows to sample an intensity pattern (I) generated by such a device simultaneously at different positions.


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