The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Jun. 15, 2009
Haidong Zhu, San Diego, CA (US);
Dumitru Mihai Ionescu, San Diego, CA (US);
Abu Amanullah, San Diego, CA (US);
Haidong Zhu, San Diego, CA (US);
Dumitru Mihai Ionescu, San Diego, CA (US);
Abu Amanullah, San Diego, CA (US);
Olympus Corporation, Tokyo, JP;
Abstract
A method for determining an overlap and add length estimate comprises determining a plurality of correlation values of a plurality of ordered frequency domain samples obtained from a data frame; comparing the correlation values of a first subset of the samples to a first predetermined threshold to determine a first edge sample; comparing the correlation values of a second subset of the samples to a second predetermined threshold to determine a second edge sample; using the first and second edge samples to determine an overlap and add length estimate; and providing the overlap and add length estimate to an overlap and add circuit.