The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Jun. 02, 2010
Applicants:

Andreas Pamer, Wallern, AT;

Guenter Ritzberger, Ansfelden, AT;

Friedrich Oberzaucher, Wels, AT;

Inventors:

Andreas Pamer, Wallern, AT;

Guenter Ritzberger, Ansfelden, AT;

Friedrich Oberzaucher, Wels, AT;

Assignee:

Fronius International GmbH, Pettenbach, AT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H02H 3/00 (2006.01); H02H 3/10 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for detecting arcs in a direct-current path of a photovoltaic system, wherein values of a current (I) of the direct-current path are detected during a repeating time frame () and a mean value () is generated, and such a photovoltaic system. In order to reliably detect arcs by means of a component of the photovoltaic system, values of a voltage (U), of the direct-current path are detected during the time frame () and a mean value () is generated, and at least one detection signal () and at least one detection threshold () are continuously calculated based on the mean values () for the current (I) and the voltage (U) by means of a calculation method.


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