The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Apr. 09, 2009
Applicants:

Edin Andelic, Stuttgart, DE;

Rudiger Frank, Haigerloch, DE;

Inventors:

Edin Andelic, Stuttgart, DE;

Rudiger Frank, Haigerloch, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for turbidity measurement in a measured medium uses a turbidity sensor, which comprises at least a first and a second emitter and at least a first and a second detector. The first and the second emitters are excited one after the other to produce light signals directed into the measured medium; wherein each light signal travels along a first propagation path through the measured medium to the first detector, and is converted by such into a first detector signal; and travels along a second propagation path through the measured medium to the second detector, and is converted by such into a second detector signal. A turbidity value is ascertained based on the first and the second detector signals; wherein, by means of at least one additional detector, to which at least one of the light signals travels along an additional propagation path, an additional detector signal is ascertained, and, on the basis of the additional detector signal, the turbidity value is checked as regards its plausibility.


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