The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Sep. 02, 2011
Applicants:

David W. Henry, Platte Citty, MO (US);

Kiley Beard, Kearney, MO (US);

William Thurston, Kansas City, MO (US);

Jason W. Farris, Overland Park, KS (US);

Bradley Smith, Mission, KS (US);

Inventors:

David W. Henry, Platte Citty, MO (US);

Kiley Beard, Kearney, MO (US);

William Thurston, Kansas City, MO (US);

Jason W. Farris, Overland Park, KS (US);

Bradley Smith, Mission, KS (US);

Assignee:

Interconnect Devices, Inc., Kansas City, KS (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A test contact may include a first portion having an open-ended rounded shape. The first portion may define an opening therethrough. The test contact may include a second portion having a curved structure. The first portion and the second portion may be formed integrally, and the second portion may be configured to contact a portion of a device lead.


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