The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
May. 26, 2011
Applicants:
Shih-chieh Chao, Taipei, TW;
Chih-wen Huang, Taipei, TW;
Inventors:
Shih-Chieh Chao, Taipei, TW;
Chih-Wen Huang, Taipei, TW;
Assignee:
Tatung Company, Taipei, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
A planar magnetic field probe is provided. The planar magnetic field probe increases the sensitivity of magnetic field intensity detection by using a left multi-sensor loop and a right multi-sensor loop formed by a first patterned metal layer and a second patterned metal layer, and decreases the electric field noise coupling by surrounding the left multi-sensor loop and the right multi-sensor loop with a symmetrical shielding metal structure formed by a first patterned shielding metal layer, a second patterned shielding metal layer and a plurality of through vias.