The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Sep. 15, 2010
Applicants:

Jae-han Cha, Cheongju-Si, KR;

Kyung-ho Lee, Cheongju-Si, KR;

Sun-goo Kim, Cheongju-Si, KR;

Hyung-suk Choi, Cheongju-Si, KR;

Ju-ho Kim, Cheongju-Si, KR;

Jin-young Chae, Cheongju-Si, KR;

In-taek OH, Cheongju-Si, KR;

Inventors:

Jae-Han Cha, Cheongju-Si, KR;

Kyung-Ho Lee, Cheongju-Si, KR;

Sun-Goo Kim, Cheongju-Si, KR;

Hyung-Suk Choi, Cheongju-Si, KR;

Ju-Ho Kim, Cheongju-Si, KR;

Jin-Young Chae, Cheongju-Si, KR;

In-Taek Oh, Cheongju-Si, KR;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/70 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device includes: an active region configured over a substrate to include a first conductive-type first deep well and second conductive-type second deep well forming a junction therebetween. A gate electrode extends across the junction and over a portion of first conductive-type first deep well and a portion of the second conductive-type second deep well. A second conductive-type source region is in the first conductive-type first deep well at one side of the gate electrode whereas a second conductive-type drain region is in the second conductive-type second deep well on another side of the gate electrode. A first conductive-type impurity region is in the first conductive-type first deep well surrounding the second conductive-type source region and extending toward the junction so as to partially overlap with the gate electrode and/or partially overlap with the second conductive-type source region.


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