The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Feb. 23, 2009
Kanetada Nagamine, Kashiwa, JP;
Kanetada Nagamine, Kashiwa, JP;
Abstract
The invention provides a nondestructive inspection apparatus and nondestructive inspection method for inspecting the inside of a surface layer of a composite structure using cosmic-ray muons. The nondestructive inspection apparatus is to inspect the inside of the surface layer of a composite structureusing cosmic-ray muonsincoming substantially in the horizontal direction with being spin polarized by a given amount in the incoming direction, and has positron/electron amount detecting meansfor detecting a positron/electron amount reflection-emitted having a characteristic time constant in the direction opposite to the incoming direction of the cosmic-ray muonsby the decay of the cosmic-ray muonsstopping inside the composite structure, and radiography data processing meansfor data-processing a state of the second substance-different from the first substance-of the surface layer existing inside the surface layer of the composite structureas radiography to output, from the positron/electron amount detected in the positron/electron detecting means