The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Apr. 25, 2012
Applicants:
Takashi Nakagawa, Kyoto, JP;
Shinya Nakajima, Kyoto, JP;
Tokuo Kasai, Kyoto, JP;
Inventors:
Assignee:
ARKRAY, Inc., Kyoto-shi, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/75 (2006.01); G06Q 50/00 (2012.01);
U.S. Cl.
CPC ...
Abstract
It is an object to provide a test instrument and an optical measurement apparatus which enable easy matching of test results when tests by optical measurement are performed with respect to a large number of patients. To the above end, a test instrument B is provided, which includes reagent retaining portionsA,B,C retaining a reagent which reacts with a sample to produce a color reaction. The test instrument B includes a patient information entry sectionas an example of patient identifying information region in which patient identifying information is to be written.