The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Apr. 02, 2010
Applicants:

Hiroshi Koizumi, Tokyo, JP;

Koki Harumoto, Tokyo, JP;

Tsutomu Kikawa, Tokyo, JP;

Takefumi Hayashi, Tokyo, JP;

Inventors:

Hiroshi Koizumi, Tokyo, JP;

Koki Harumoto, Tokyo, JP;

Tsutomu Kikawa, Tokyo, JP;

Takefumi Hayashi, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 3/14 (2006.01); A61B 3/15 (2006.01); A61B 3/12 (2006.01);
U.S. Cl.
CPC ...
A61B 3/152 (2013.01); A61B 3/1225 (2013.01); A61B 3/14 (2013.01);
Abstract

The fundus observation apparatushas a function to form tomographic images and 3-dimensional images of a fundus Ef by scanning signal light LS as well as a function to form a moving image (observation image K) of a fundus Ef during OCT measurement. Furthermore, the fundus observation apparatusincludes an x-correction partand a y-correction partfor correcting a position in the fundus surface direction of the 3-dimensional image based on the observation image K, and a z-correction partfor correcting the position in the fundus depth direction of a 3-dimensional image, based on a tomographic image Gi of the fundus Ef based on the detection results of interference light LC of separately scanned signal light LS and reference light LR.


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