The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2013
Filed:
Dec. 17, 2010
Fraser Mcneil-watson, Malvern, GB;
Fraser McNeil-Watson, Malvern, GB;
Malvern Instruments, Ltd., Malvern, GB;
Abstract
In one general aspect, an instrument for measuring characteristics of particles suspended in a fluid is disclosed. It includes a closed wall surface defining a fractionation channel having a input opening, an output opening, and a flow axis that spans downstream from the input opening for the channel to the output opening. A force application subsystem has a force application output oriented perpendicular to at least part of the flow axis of the fractionation channel. A particle characteristic measurement subsystem is located hydraulically downstream from at least a portion of the closed wall surface defining the fractionation channel, and includes a sensor positioned to sense a property of the suspended particles in the potential measurement subsystem as well as a signal output responsive to the sensor. A result processor has a signal input responsive to the signal output of the particle characteristic measurement subsystem, zeta potential processing logic responsive to the particle characteristic measurement subsystem, and a particle characteristic signal output responsive to the particle characteristic processing logic.