The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 05, 2013

Filed:

Mar. 01, 2011
Applicants:

Timothy A. Tomberlin, Houston, TX (US);

Bryan A. Vandal, Okotoks, CA;

Grant W. Byerley, Katy, TX (US);

Zachary L. A. Linkewich, Corchrane, CA;

Inventors:

Timothy A. Tomberlin, Houston, TX (US);

Bryan A. Vandal, Okotoks, CA;

Grant W. Byerley, Katy, TX (US);

Zachary L. A. Linkewich, Corchrane, CA;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
E21B 47/00 (2012.01); E21B 47/10 (2012.01); E21B 47/022 (2012.01);
U.S. Cl.
CPC ...
E21B 47/1015 (2013.01); E21B 47/02216 (2013.01);
Abstract

Method, devices and systems are provided for measuring deformation in subterranean formations. Such methods include introduction of spaced-apart depth magnetic markers along the longitudinal length of a well bore and measuring the position of each depth marker over time so as to determine deformation of the subterranean formation. In certain embodiments, depth markers comprise rare earth magnets. In further embodiments, orientation of each magnetic bullet is determined over time to determine the change in orientation of each magnetic bullet. Advantages of the methods and devices herein include, but are not limited to, improved accuracy and reliability of deformation measurements and reduced environmental impact due to the avoidance of radioactive markers used by the present invention.


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