The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8572447 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 29, 2013

Filed:

Jun. 06, 2011
Applicant:

Hervé Le-gall, Saint Martin d'Uriage, FR;

Inventor:

Hervé Le-Gall, Saint Martin d'Uriage, FR;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G06F 11/00 (2006.01); G06F 7/02 (2006.01); H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of testing a data connection using at least one test sequence, the method including providing a first bit sequence by a first generator; duplicating the first bit sequence to generate a second bit sequence identical to the first; and generating the at least one test sequence based on the first and second bit sequences and transmitting the at least one test sequence over a data connection to be tested.


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Le-Gall, Hervé. (2013). Circuitry for built-in self-test (U.S. Patent No. 8572447). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8572447

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