The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2013

Filed:

Mar. 25, 2010
Applicants:

Brian C. Banister, San Diego, CA (US);

Surendra Boppana, San Diego, CA (US);

Inventors:

Brian C. Banister, San Diego, CA (US);

Surendra Boppana, San Diego, CA (US);

Assignee:

QUALCOMM Incorporated, San Diego, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed are apparatus and methods for dynamic data-based scaling of data. The disclosed methods and apparatus involve storing one or more input data samples, which are to be scaled and input to a processing function such as a Fast Fourier Transform. A scaling value operable for scaling the one or more data samples is determined based on the one or more input data samples, and then the stored data samples are scaled based on the computed scaling value when read out of storage prior to the processing function. The scaling of data based on the input data allows the data to be scaled dynamically, not statically, and ensures that the data fits within a desired bit width constraint of the processing function thereby economizing processing resources.


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